[PDF.70fs] Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)
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Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)
Charles Chiang, Jamil Kawa
[PDF.tc53] Design for Manufacturability and Yield for Nano-Scale CMOS (Integrated Circuits and Systems)
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| #14019666 in Books | 2010-11-23 | Original language:English | PDF # 1 | 9.25 x.65 x6.10l,.90 | File type: PDF | 255 pages||0 of 0 people found the following review helpful.| Too simplistic!|By Mann|This is a very simplistic book and probably not fit for publication. It comes across like a collection of marketing notes and slides hastily prepared with not much depth. After reviewing the book I realized I can find more in depth description of topics related to design for manufacturing and yield from searching the internet for free!|2 of 4 people fou|From the Publisher|Written for:| ASIC/ SOC designers, EDA R&D engineers, professors and graduate students| Keywords:| -CAD (Computer aided design)| -CAE (Computer aided engineering)| -DFM (Design for manufacturability)| -DFY (Design for yield)| -SOC (System on
This book walks the reader through all the aspects of manufacturability and yield in a nano-CMOS process. It covers all CAD/CAE aspects of a SOC design flow and addresses a new topic (DFM/DFY) critical at 90 nm and beyond. This book is a must read book the serious practicing IC designer and an excellent primer for any graduate student intent on having a career in IC design or in EDA tool development.
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