[PDF.63ab] High Quality Test Pattern Generation and Boolean Satisfiability

High Quality Test Pattern Generation and Boolean Satisfiability

[PDF.ih99] High Quality Test Pattern Generation and Boolean Satisfiability

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 |  2014-10-20 |  2012-01-02 | Original language:English | PDF # 1 |  9.25 x.48 x6.10l,.67 | File type: PDF | 193 pages

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||From the Back Cover||This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT).  A fast and highly fault efficient SAT-based ATPG framework is presented which is also able to generate high-quality delay tests such as robust path delay tests, as well as tests with long propagation paths to detect small delay defects.

 

The aim of the techniques and meth...

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